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automatic test pattern generation中文是什么意思

  • atpg
  • 自动测试模式产生
  • 自动产生测试图案

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  • 例句与用法
  • Automatic test pattern generation for multi - clock digital system based on s amp; amp; cct
    基于安全充分捕获技术的多时钟数字系统测试矢量生成
  • An automatic test pattern generation ( atpg ) algorithm for deliberately selected delay faults is presented to cope with the crosstalk - induced delay effects on longer paths
    由于电路中较长的通路具有较短的松弛时间,因此容易因为串扰问题产生时延故障。
  • 百科解释
ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, and in some cases to assist with determining the cause of failure (failure analysis.
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Last modified time:Fri, 15 Aug 2025 00:29:56 GMT

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